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SN74BCT8373ADW

Texas Instruments
SN74BCT8373ADW Preview
Texas Instruments
IC SCAN TEST DEVICE LATCH 24SOIC
$7.01
Available to order
Reference Price (USD)
75+
$9.23320
Exquisite packaging
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SN74BCT8373ADW

SN74BCT8373ADW

$7.01

Product details

The SN74BCT8373ADW from Texas Instruments is a high-performance specialty logic IC designed for advanced digital systems. This integrated circuit excels in managing complex logic operations, ensuring reliable performance in demanding applications. Its robust architecture supports seamless integration with various digital components, making it a versatile choice for modern electronic designs. The SN74BCT8373ADW is engineered to deliver optimal speed and efficiency, catering to the needs of high-speed data processing and control systems. With its exceptional reliability and durability, this IC is ideal for applications requiring precise logic control and signal management. The SN74BCT8373ADW is a testament to Texas Instruments's commitment to innovation and quality in the field of specialty logic ICs. Key features include advanced noise immunity, low power consumption, and compatibility with multiple logic families. These attributes make it suitable for a wide range of industrial and commercial applications. Whether you're designing cutting-edge communication systems or sophisticated automation solutions, the SN74BCT8373ADW offers the performance and flexibility you need. Explore the potential of this specialty logic IC and elevate your next project with Texas Instruments's cutting-edge technology. Contact us today to request a quote or learn more about how the SN74BCT8373ADW can meet your specific requirements.

General specs

  • Product Status: Active
  • Logic Type: Scan Test Device with D-Type Latches
  • Supply Voltage: 4.5V ~ 5.5V
  • Number of Bits: 8
  • Operating Temperature: 0°C ~ 70°C
  • Mounting Type: Surface Mount
  • Package / Case: 24-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package: 24-SOIC

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