SN74ABT8646DW
Texas Instruments
Texas Instruments
IC SCAN-TEST-DEV/XCVR 28-SOIC
$7.81
Available to order
Reference Price (USD)
1+
$10.54000
20+
$9.69050
40+
$9.28875
100+
$8.18420
500+
$7.28046
1,000+
$6.67793
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Product details
General specs
- Product Status: Active
- Logic Type: Scan Test Device with Bus Transceiver and Registers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 28-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 28-SOIC