SN74BCT8244ADW
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC
$13.04
Available to order
Reference Price (USD)
1+
$11.72000
10+
$10.77100
25+
$10.32480
100+
$9.09700
500+
$8.09246
1,000+
$7.42273
Exquisite packaging
Discount
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Product details
General specs
- Product Status: Active
- Logic Type: Scan Test Device with Buffers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC