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SN74LVTH182512DGGR

Texas Instruments
SN74LVTH182512DGGR Preview
Texas Instruments
IC SCAN-TEST-DEV/XCVR 64-TSSOP
$9.05
Available to order
Reference Price (USD)
2,000+
$4.44080
Exquisite packaging
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SN74LVTH182512DGGR

SN74LVTH182512DGGR

$9.05

Product details

General specs

  • Product Status: Active
  • Logic Type: ABT Scan Test Device With Universal Bus Transceivers
  • Supply Voltage: 2.7V ~ 3.6V
  • Number of Bits: 18
  • Operating Temperature: -40°C ~ 85°C
  • Mounting Type: Surface Mount
  • Package / Case: 64-TFSOP (0.240", 6.10mm Width)
  • Supplier Device Package: 64-TSSOP

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