SN74LVTH182504APM
Texas Instruments
Texas Instruments
IC SCAN-TEST-DEV/XCVR 64-LQFP
$5.06
Available to order
Reference Price (USD)
1+
$8.13000
10+
$7.34400
25+
$7.00280
160+
$6.08050
640+
$5.29480
1,120+
$4.61160
Exquisite packaging
Discount
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Product details
General specs
- Product Status: Active
- Logic Type: ABT Scan Test Device With Universal Bus Transceivers
- Supply Voltage: 2.7V ~ 3.6V
- Number of Bits: 20
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 64-LQFP
- Supplier Device Package: 64-LQFP (10x10)