SN74BCT8373ANT
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE LATCH 24-DIP
$5.55
Available to order
Reference Price (USD)
1+
$5.55000
500+
$5.4945
1000+
$5.439
1500+
$5.3835
2000+
$5.328
2500+
$5.2725
Exquisite packaging
Discount
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| EMS | 3-7 days |
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SN74BCT8373ANT
$5.55
Product details
General specs
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Latches
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
