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SN74BCT8373ADWRG4

Texas Instruments
SN74BCT8373ADWRG4 Preview
Texas Instruments
IC SCAN TEST DEVICE 24SOIC
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SN74BCT8373ADWRG4

SN74BCT8373ADWRG4

$0.00

Product details

Enhance your digital systems with the SN74BCT8373ADWRG4 specialty logic IC from Texas Instruments. This advanced integrated circuit is designed to handle complex logic functions with precision and efficiency. Its innovative architecture ensures high-speed operation and minimal latency, making it perfect for time-critical applications. The SN74BCT8373ADWRG4 boasts excellent signal integrity and noise reduction capabilities, ensuring reliable performance even in electrically noisy environments. With its low power consumption and thermal efficiency, this IC is an eco-friendly choice for modern electronic designs. The SN74BCT8373ADWRG4 is compatible with various logic standards, offering designers greater flexibility in system integration. Its compact form factor and robust construction make it suitable for space-constrained applications without compromising performance. From industrial automation to telecommunications infrastructure, the SN74BCT8373ADWRG4 delivers consistent results across diverse sectors. Automotive electronics, medical devices, and aerospace systems can all benefit from its reliable logic processing capabilities. Texas Instruments has engineered this IC to meet the highest industry standards for quality and performance. Discover how the SN74BCT8373ADWRG4 can optimize your logic circuits and improve overall system efficiency. Visit our website to submit an inquiry or speak with our technical experts about incorporating this specialty logic IC into your next design.

General specs

  • Product Status: Obsolete
  • Logic Type: Scan Test Device with D-Type Latches
  • Supply Voltage: 4.5V ~ 5.5V
  • Number of Bits: 8
  • Operating Temperature: 0°C ~ 70°C
  • Mounting Type: Surface Mount
  • Package / Case: 24-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package: 24-SOIC

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