SN74ABT8952DW
Texas Instruments
Texas Instruments
IC SCAN-TEST-DEV/XCVR 28-SOIC
$6.62
Available to order
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500+
$6.5538
1000+
$6.4876
1500+
$6.4214
2000+
$6.3552
2500+
$6.289
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SN74ABT8952DW
$6.62
Product details
General specs
- Product Status: Obsolete
- Logic Type: Scan Test Device with Registered Bus Transceiver
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 28-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 28-SOIC
