SN74ABT8245DWR
Texas Instruments
Texas Instruments
IC SCAN TEST DEV W/OBT 24-SOIC
$4.20
Available to order
Reference Price (USD)
2,000+
$3.49960
Exquisite packaging
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Product details
General specs
- Product Status: Active
- Logic Type: Scan Test Device with Bus Transceivers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC