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SN74ABT8245DWR

Texas Instruments
SN74ABT8245DWR Preview
Texas Instruments
IC SCAN TEST DEV W/OBT 24-SOIC
$4.20
Available to order
Reference Price (USD)
2,000+
$3.49960
Exquisite packaging
Discount
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SN74ABT8245DWR

SN74ABT8245DWR

$4.20

Product details

General specs

  • Product Status: Active
  • Logic Type: Scan Test Device with Bus Transceivers
  • Supply Voltage: 4.5V ~ 5.5V
  • Number of Bits: 8
  • Operating Temperature: -40°C ~ 85°C
  • Mounting Type: Surface Mount
  • Package / Case: 24-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package: 24-SOIC

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